Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7131617 | Optics and Lasers in Engineering | 2018 | 7 Pages |
Abstract
For the multi-lateral shearing interferometers (multi-LSIs), the measurement accuracy can be enhanced by estimating the wavefront under test with the multidirectional phase information encoded in the shearing interferogram. Usually the multi-LSIs reconstruct the test wavefront from the phase derivatives in multiple directions using the discrete Fourier transforms (DFT) method, which is only suitable to small shear ratios and relatively sensitive to noise. To improve the accuracy of multi-LSIs, wavefront reconstruction from the multidirectional phase differences using the difference Zernike polynomials fitting (DZPF) method is proposed in this paper. For the DZPF method applied in the quadriwave LSI, difference Zernike polynomials in only two orthogonal shear directions are required to represent the phase differences in multiple shear directions. In this way, the test wavefront can be reconstructed from the phase differences in multiple shear directions using a noise-variance weighted least-squares method with almost no extra computational burden, compared with the usual recovery from the phase differences in two orthogonal directions. Numerical simulation results show that the DZPF method can maintain high reconstruction accuracy in a wider range of shear ratios and has much better anti-noise performance than the DFT method. A null test experiment of the quadriwave LSI has been conducted and the experimental results show that the measurement accuracy of the quadriwave LSI can be improved from 0.0054 λ rms to 0.0029 λ rms (λâ¯=â¯632.8â¯nm) by substituting the DFT method with the proposed DZPF method in the wavefront reconstruction process.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Liu Ke, Wang Jiannian, Wang Hai, Li Yanqiu,