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Quality control and authentication of packaged integrated circuits using enhanced-spatial-resolution terahertz time-domain spectroscopy and imaging

Article ID Journal Published Year Pages File Type
7131818 Optics and Lasers in Engineering 2018 11 Pages PDF
Keywords
Non-destructive testingAuthenticationTerahertz time-domain spectroscopyMetrologyquality control
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
Preview
Quality control and authentication of packaged integrated circuits using enhanced-spatial-resolution terahertz time-domain spectroscopy and imaging
Authors
Kiarash Ahi, Sina Shahbazmohamadi, Navid Asadizanjani,
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Journal
Optics and Lasers in Engineering
Journal: Optics and Lasers in Engineering
Related Categories
Non-destructive testing
Authentication
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quality control
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