Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7133091 | Optics and Lasers in Engineering | 2014 | 6 Pages |
Abstract
This paper presents a novel method to construct binary patterns for high-quality 3D shape measurement. The algorithm generates small patches using symmetry and periodicity, randomly initializes each pixels, optimizes the small patches through mutations, and finally tiles the optimized patches into full size patterns using again symmetry and periodicity. We will demonstrate that the proposed method can achieve substantial phase quality improvements over the dithering techniques for different amounts of defocusing.
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Authors
Junfei Dai, Beiwen Li, Song Zhang,