| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7134810 | Sensors and Actuators A: Physical | 2016 | 4 Pages |
Abstract
The real and imaginary parts of dielectric permittivity of semi-insulating Cd1âxZnxTe (Ñ
 = 0.05-0.15) crystals had been measured. Also we studied energy resolution of radiation detectors made from these crystals under 137Cs radiation. These studies have been carried out on specimens from different crystal ingot regions and taking it into account. It is ascertained that investigated permittivity values correlate with energy resolution of detectors. Such correlation is explained with presence of electrically active defects in the crystal volume which have been generated during the growth.
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Authors
O.O. Poluboiarov, O.N. Chugai, S.V. Oleynick, S.V. Sulima,