Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7150388 | Solid-State Electronics | 2018 | 25 Pages |
Abstract
The band-modulation and sharp-switching mechanisms in Z2-FET device operated as a capacitorless 1T-DRAM memory are reviewed. The main parameters that govern the memory performance are discussed based on detailed experiments and simulations. This 1T-DRAM memory does not suffer from super-coupling effect and can be integrated in sub-10â¯nm thick SOI films. It offers low leakage current, high current margin, long retention, low operating voltage especially for programming, and high speed. The Z2-FET is suitable for embedded memory applications.
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Authors
S. Cristoloveanu, K.H. Lee, M.S. Parihar, H. El Dirani, J. Lacord, S. Martinie, C. Le Royer, J.-Ch. Barbe, X. Mescot, P. Fonteneau, Ph. Galy, F. Gamiz, C. Navarro, B. Cheng, M. Duan, F. Adamu-Lema, A. Asenov, Y. Taur, M. Bawedin,