Article ID Journal Published Year Pages File Type
7150899 Solid-State Electronics 2016 10 Pages PDF
Abstract
Accurate closed form expressions for extraction of sheet resistance and mobility from Van-der-Pauw measurement on devices with four large contacts and 90° symmetry.190
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Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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Closed form expressions for sheet resistance and mobility from Van-der-Pauw measurement on 90° symmetric devices with four arbitrary contacts
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