Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7195674 | Reliability Engineering & System Safety | 2015 | 36 Pages |
Abstract
Influenced by defects or contaminants remaining after a series of manufacturing processes, the degradation paths of some products exhibit two-phase patterns over the testing period. This paper proposes a hierarchical Bayesian change-point regression model to fit the two-phase degradation patterns, and derives the failure-time distribution of a unit that is randomly selected from its population. A Gibbs sampling algorithm is developed for the inference of the parameters in the change-point degradation model, as well as for the prediction of the failure-time distribution of the randomly selected unit. The proposed approach is applied to the degradation paths of plasma display panels (PDPs) presenting the two-phase pattern.
Related Topics
Physical Sciences and Engineering
Engineering
Mechanical Engineering
Authors
Suk Joo Bae, Tao Yuan, Shuluo Ning, Way Kuo,