Cr3+ doped NaF-ZrO2-B2O3-SiO2 glass ceramic materials for optoelectronic device application

The glass materials of composition (25-x)NaF-5.0ZrO2-10B2O3-60SiO2: x Cr2O3 (0 ≤ × ≤ 0.5) were synthesized. Structural (XRD, SEM, EDS and DTA), optical (optical absorption and photoluminescence), DC conductivity and dielectric investigations of all these glass ceramic materials were studied. Different physical parameters such as density (ρ), refractive index (μ), polaron radius (ri), field strength (Fi), optical basicity (Λth) and molar volume (Vm) were calculated. The glass transition temperature (Tg) and glass crystallization temperatures (Tc) of these materials were recorded by using DTA studies. The decrease in the value of theoretical optical basicity with increasing Cr2O3 concentration of the present glass ceramic materials suggests the increase in covalence. Various optical parameters such as bandgap (Eo), nephelauxetic ratio (β), transition probability (A) and emissive cross-section (φ) were calculated. Different dielectric parameters such as density of states near Fermi level, activation energy for dipoles and temperature region of relaxation were also calculated. The observed studies suggest that these materials are suitable for both optical and electronic device applications.