Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
726026 | Journal of Electrostatics | 2012 | 10 Pages |
This paper presents a development of a low-voltage decay time analyzer to replace the charged plate monitor which works at the high-voltage level. The proposed low-voltage decay time analyzer is based on the measurement of the induced charges on a conductive plate via an ultra-high input impedance amplifier. A microcontroller with an Ethernet module is the central processing to control, calculate the decay time, and enable network communications. The test results show that the analyzed decay times correlate to the standard test method.
► We propose a new low-voltage decay time analyzer for evaluating ionizers. ► The decay time at low-voltage operation has been obtained by RC modeling. ► A microcontroller with an Ethernet module enables network communication. ► The results were correlated to the high-voltage operation mentioned by the standard method. ► The proposed prototype is smaller size and convenient than the conventional equipment.