Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
727884 | Materials Science in Semiconductor Processing | 2015 | 8 Pages |
Abstract
Cadmium Sulfide and Ferrous doped Cadmium Sulfide thin films have been prepared on different substrates using an electrodeposition technique. Linear sweep voltammetric analysis has been carried out to determine deposition potential of the prepared films. X-ray diffraction analysis showed that the prepared films possess polycrystalline nature with hexagonal structure. Surface morphology and film composition have been analyzed using Scanning electron microscopy and Energy dispersive analysis by X-rays. Optical absorption analysis showed that the prepared films are found to exhibit Band gap value in the range between 2.3, 2.8 eV for Cadmium Sulfide and Ferrous doped Cadmium Sulfide.
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Electrical and Electronic Engineering
Authors
S. Thanikaikarasan, T. Mahalingam, M. Raja, S. Velumani,