Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
728772 | Materials Science in Semiconductor Processing | 2011 | 5 Pages |
Abstract
The optical property was studied on the Si0.8Ge0.2/Si strained multiple quantum well (MQW) structure grown using ultra-high vacuum chemical vapor deposition (UHV-CVD). Three peaks are observed in Raman spectrum, which are located at about 510, 410, and 300Â cmâ1, corresponding to the vibration of Si-Si, Si-Ge, and Ge-Ge phonons, respectively. The photoluminescence (PL) spectrum originates from the radiative recombinations both from the Si substrate and the Si0.8Ge0.2/Si MQW. For Si0.8Ge0.2/Si strained MQW, the transition peaks related to the MQW region observed in the photocurrent (PC) spectrum were preliminarily assigned to electron-heavy hole (e-hh) and electron-light hole (e-lh) fundamental excitonic transitions.
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Authors
K.H. Shim, Y.-H. Kil, H.K. Lee, M.I. Shin, T.S. Jeong, S. Kang, C.-J. Choi, T.S. Kim,