| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 728859 | Materials Science in Semiconductor Processing | 2010 | 6 Pages |
CdSexTe1−x films were deposited by the slurry coating technique using CdSexTe1−x powders synthesized in the laboratory. X-ray diffraction studies indicated the formation of a hexagonal phase. From EDAX compositional analysis, the individual concentrations of Se and Te in the films were estimated. Analysis of the optical data indicate the band gap to vary from 1.44 to 1.68 eV as the value of ‘x’ changes from 0 to 1. XPS analysis was also carried out on the films. The films were used as photoanodes in polysulphide electrolyte and it was observed that the films with composition CdSe0.6Te0.4 exhibited the maximum photoactivity. The Mott–Schottky plot indicated an n-type behaviour. Spectral response measurements were made and the electrodes exhibited a quantum efficiency of 0.6.
