Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
728890 | Measurement | 2006 | 4 Pages |
Abstract
A stationary absolute method for the thermal conductivity measurement of semiconductor materials is developed. Accuracy and reproducibility of the method is provided with the strict account of thermal losses and temperature drops in the contacts’ regions.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
A.I. Vahanyan,