| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 728927 | Materials Science in Semiconductor Processing | 2012 | 5 Pages |
Copper Indium Diselenide (CuInSe2) thin films of different atomic concentrations were prepared using sequential elemental evaporation. Raman analysis has been carried out to determine the structure and the different vibration modes of CuInSe2 thin film. The analysis reveals that CuInSe2 films possess chalcopyrite structure with preferential orientation along (112) plane. Vibration modes such as A1, B1, B2 and E were observed in the Raman spectra. It has been observed that the intensity of the A1 mode is directly proportional to the crystallinity. Also it has been noted that, the intensity of all the vibration modes are varied with respect to the compositions. The Raman spectra of the CuInSe2 films were interpreted and incorporated with XRD and EDAX.
