Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
729018 | Materials Science in Semiconductor Processing | 2006 | 5 Pages |
Abstract
In this work we have investigated the influence of the Ge composition on the minority carrier lifetime in Czochralski (Cz) grown monocrystalline Si1âxGex alloys in the composition range of 0
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Authors
A.G. Ulyashin, N.V. Abrosimov, A. Bentzen, A. Suphellen, E. Sauar, B.G. Svensson,