Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
729222 | Materials Science in Semiconductor Processing | 2015 | 8 Pages |
Abstract
Bis(O-alkylxanthato)nickel(II) complexes (alkyl=hexyl and octyl) have been synthesised and their X-ray single crystal structures determined. Nickel sulfide thin films were deposited from both complexes at different deposition temperatures by the aerosol assisted chemical vapour deposition (AACVD) method. Phase pure rhombohedral NiS and mixture of rhombohedral NiS (millerites) and Ni17S18 were deposited onto the glass and silicon substrates at temperatures between 250 and 400 °C. SEM images show that the films are based on irregular grains, nanodendrites and feather like morphologies.
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Authors
Masood Akhtar, Neerish Revaprasadu, Mohammad Azad Malik, James Raftery,