| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 729574 | Measurement | 2015 | 5 Pages |
Abstract
The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.
Related Topics
Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
Yao-Chin Wang, Bor-Shyh Lin, Ming-Che Chan,