Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
729628 | Materials Science in Semiconductor Processing | 2010 | 4 Pages |
Abstract
Cadmium sulfide (CdS) thin films were deposited by the flash evaporation technique onto glass substrates kept at temperatures in the range 30–300 °C. The source material was CdS powder synthesized in the laboratory. The films exhibited hexagonal structure with dislocation density and the stress decreased as the substrate temperature increased. An optical band gap of 2.39 eV was obtained for the films deposited at 300 °C. Raman spectra exhibited peaks corresponding to Longitudinal Optical phonons of CdS with the full width at half maximum decreasing with increase of substrate temperature. Room temperature resistivity values are lower than earlier reports on chemically deposited CdS films.
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Authors
K.R. Murali, C. Kannan, P.K. Subramanian,