Noise sensitivity of the exponential histogram ADC test

This paper deals with some error effects caused by additive noise at analogue-to-digital converters (ADCs) testing based on the histogram method and the exponential shape of input testing stimulus. The histogram method with the exponential stimulus has been an alternative test method for ADC that was developed by the authors of this paper. Here, the theoretical analysis of some errors in estimations of code bin widths and quantisation levels caused by additive input Gaussian noise is performed. The theoretical results are verified by simulations and experimental tests. Finally the noise sensitivity of the exponential histogram test method is compared with the known noise sensitivity of the standardised sinewave histogram test method.