Resistance measurement of isolated single-walled carbon nanotubes

Conductive atomic force microscopy (CAFM) and Kelvin force microscopy (KFM) were used to measure the resistance of isolated single-walled carbon nanotubes (SWNTs). By analyzing the current map and surface potential obtained from CAFM and KFM methods respectively, the intrinsic resistance of SWNTs could be calculated. The results calculated by these two methods are the same for the same batch of SWNTs, which is on the order of 107–108 Ω.

► The resistance of isolated single-walled carbon nanotubes was measured. ► Conductive atomic force microscopy and Kelvin force microscopy were used. ► The resistances are the same for the same batch of nanotubes by the two methods.