| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 731630 | Measurement | 2009 | 7 Pages |
Abstract
A fast non-interferometric system for measurement of diffraction patterns based on the incidence of partially coherent light in display glass is assembled. The system operates both in transmission and in reflection modes in an environment that is prone to vibrations and misalignments. Asymmetric defects are measured and compared to a white-light interferometer. The system provides an acceptable qualitative measurement for an on-site detection of asymmetric defects leading to a better understanding of this class of imperfections.
Related Topics
Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
Vitor M. Schneider, Michal Mlejnek, Kevin T. Gahagan,