Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
732789 | Optics & Laser Technology | 2011 | 5 Pages |
Abstract
Surface plasmon resonance sensors based on Ag-metalized nanolayer in microstructured optical fibers are theoretically analyzed by using finite element method (FEM). In our simulations we use Drude–Lorentz model to describe the metal dielectric constant. The numerical results show that the sensitivity of Ag-metalized SPR sensor could reach 1167 nm/RIU and corresponding resolution is 8.57×10−5 RIU. Compared to conventional Au-metalized SPR sensors the performance of our device is obviously better.
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Authors
Long Zheng, Xia Zhang, Xiaomin Ren, Jing Gao, Lei Shi, Xiaolong Liu, Qi Wang, Yongqing Huang,