Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
734212 | Optics & Laser Technology | 2008 | 7 Pages |
Broad flat field laser scanning is critical to the success of laser material processing, used in techniques such as rapid prototyping & manufacturing (RP&M) and micro-machining. For these techniques it is necessary to produce high-performance optical systems that can fulfill the need for a smaller focused spot size over broad, flat field scanning areas. This paper concentrates on the issues of defocus error compensation. A dynamic focusing system is designed, intended primarily for broad flat field galvanometric laser scanning applications. Key technologies are described in detail; corresponding solutions have been used to design and produce a CO2 infrared optical focusing system, which is capable of scanning a focused spot size of 120 μm or less over areas up to 500 mm2.