Laser-induced damages to charge coupled device detector using a high-repetition-rate and high-peak-power laser

Lasers may cause dysfunction or even irreversible damage to a charge-coupled device (CCD). Based on a thermal damaging model for a CCD when its shading Al film is illuminated by a laser, the instant temperature field and thermal stress field of the light-shading Al film were calculated. We also set up an experimental system for causing laser-induced damages to CCDs with a high-repetition-rate and high-peak-power laser. We compared the damages under different laser operating illumination modes with numerical simulations and experiments. Compared with a high-repetition-rate laser or a high-peak-power laser alone, we found that a combination of a high-repetition-rate laser and a high-peak-power laser may cause more serious damages to CCDs.

► A new type of laser damaging technology using high-repetition-rate and high-peak-power lasers was first presented. ► Comparisons of the damaging efficiency of different lasers were achieved through numerical simulations and experiments. ► Damages to a CCD detector by high-repetition-rate and high-peak-power combination lasers are serious. ► High-repetition-rate and high-peak-power combinations lasers are important laser damaging systems.