Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
735340 | Optics and Lasers in Engineering | 2012 | 6 Pages |
The theoretical background as well as the experimental results of evanescent wave holographic recording with grating periods of 3.2, 0.88 and 0.37 μm (spatial frequencies of 310 mm−1, 1140 mm−1 and 2700 mm−1) in nano-sized As2S3 films with thicknesses of 29 nm, 15 nm and 10 nm are presented. The grating recording has been performed using the interference of surface-propagating evanescent waves, created by total internal light reflection. The maximum diffraction efficiency of 5.6×10−3% has been achieved for grating period of 0.88 μm and sample thickness of 15 nm. Besides, the optical characteristics as refractive index n and extinction coefficient k of the films studied have been determined from spectrophotometric measurements in 250–650 nm wavelength region. Furthermore, drawing a connection to our previous morphological investigations, the existence of a strong relationship between microstructure, optical and holographic behavior of nano-sized As2S3 films has been revealed. On this basis the possibility of applying the evanescent – wave holography as a useful nano-tool for studying structures and different phenomena at nanometer scale has been outlined.
► We present the results of holographic recording in nano-sized thin chalcogenide films. ► The gratings are produced by the interference between two surface propagating evanescent waves or plane and evanescent wave.