Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
735422 | Optics and Lasers in Engineering | 2007 | 9 Pages |
Abstract
This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.
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Authors
Gui Yun Tian, Rong Sheng Lu, Duke Gledhill,