Article ID Journal Published Year Pages File Type
735650 Optics and Lasers in Engineering 2008 6 Pages PDF
Abstract

This study develops a non-destructive measurement system based on a position sensing detector (PSD) and a laser interferometer for determining the thickness and refractive indices of a birefringent optical wave plate. The proposed metrology system provides the ability to measure the refractive index of thick optical plates by determining the refraction angle. The experimental results obtained for the refractive index values of a commercially available wave plate are accurate to within 0.007. Furthermore, the error in the wave plate thickness measurement is just 2.37 μm. Hence, the metrology system presented in this study provides a simple yet highly accurate means of measuring the principal optical parameters of birefringent wave plates.

Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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