| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 735730 | Optics and Lasers in Engineering | 2007 | 7 Pages |
Abstract
The fundamental concept of the advanced iterative algorithm is reviewed and a detailed procedure for implementation is presented. Computer simulations are conducted to evaluate its performance for truly random phase-shifted interferograms with intra- and inter-frame intensity variations. The algorithm is implemented for random phase shifts encountered during thermal warpage measurement of a microelectronics subassembly subjected to convective thermal loading.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Zhaoyang Wang, Bongtae Han,