| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 735906 | Optics and Lasers in Engineering | 2009 | 4 Pages |
Abstract
Thermal characterization of semiconductor lasers is an important issue for optoelectronics. This paper presents our thermoreflectance measurements on two different types of laser diodes: classical ridge laser diodes and vertical cavity surface emitting lasers (VCSELs). We first studied the external temperature increase in ridge diodes in order to determine inhomogeneity. Then, we tried to determine the inner temperature of the VCSELs.
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Authors
M. Bardoux, A. Bousseksou, G. Tessier, S. Bouchoule, D. Fournier, A. Salhi, Y. Rouillard, F. Genty,