Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
736051 | Optics and Lasers in Engineering | 2006 | 8 Pages |
Abstract
A dual-function ESPI system is developed for the measurement of out-of-plane displacement and its slope change. The proposed system is convenient and also efficient to switch over from an out-of-plane sensitive configuration to shearography. A difference-of-phase method with a five-step algorithm is used for speckle fringe analysis.
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Electrical and Electronic Engineering
Authors
B. Bhaduri, N.K. Mohan, M.P. Kothiyal,