| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 739717 | Optics & Laser Technology | 2008 | 5 Pages |
Abstract
We use a setup based on an asymmetric Sagnac interferometer to demonstrate an experimental methodology to characterize the nonlinear phase of a semiconductor optical amplifier as a function of input intensity.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
M.A. Ummy, M.F. Arend, M.A. Ali, Roger Dorsinville,