| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 740008 | Optics & Laser Technology | 2006 | 6 Pages |
Abstract
Two novel systems are proposed to perform the electro-optic (EO) mapping of the electric-field strength close to electrode structure using CW laser diodes. By these systems, mappings of both static (DC) and high-frequency electric-field can be obtained. For the static field, the field is chopped to increase the sensitivity performance. For the high-frequency field, an intensity modulation laser, instead of a pulse laser, is used to perform the mapping measurement in frequency domain, instead of in time domain. This approach greatly simplifies the system. An experiment set-up using a vertical cavity surface emitted laser diode (VCSEL) of a wavelength 850Â nm and its mapping results for a coplanar waveguide (CPW) with the signal frequency around 1Â GHz are reported.
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Authors
W.K. Kuo, C.H. Pai, S.L. Huang, H.Y. Chou, H.S. Huang,