Noise-reduction for fringe analysis using the empirical mode decomposition with the generalized analysis model

Phase-extraction from fringe patterns is an inevitable procedure in many applications, such as interferometry, moiré analysis, and profilometry using structured light illumination. Errors to phase-extraction always occur when the signal-to-noise ratio is weak. In this paper, we use the empirical mode decomposition (EMD) with a generalized analysis model to reduce the white noise from a fringe pattern. It is found that phases can be extracted with high accuracy once noise-reduction is performed with this model.