Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
747347 | Solid-State Electronics | 2010 | 4 Pages |
Abstract
We have studied the contact resistance (RC) between Au and a solution-processed film of carbon nanotubes (CNTs). The test element group of the contact chain is modeled as a simple periodic series of resistors, the RC represents the resistor of the Au–CNT contact. The contact resistivity (ρC) was evaluated from RC by multiplying the contact area. When the sheet resistance (Rsh) of the CNT layer is 200 Ω/sq, the ρC is 27 μΩ cm2, which is ∼30 times of that of the Au–IZO contact at the same Rsh. This is mainly due to the three-dimensional shape of the CNT surface, resulting in a smaller contact area on the flat surface of the Au.
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Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Seung Hoon Han, Sun Hee Lee, Ji Ho Hur, Jin Jang, Young-Bae Park, Glen Irvin, Paul Drzaic,