Article ID Journal Published Year Pages File Type
747526 Solid-State Electronics 2006 4 Pages PDF
Abstract

The dark forward and reverse current–voltage characteristics of a typical BPW34 silicon photodiode have been investigated in the temperature range 80–300 K. We propose that tunnelling enhanced recombination at or close to the p/i interface plays a significant role in the dark forward current. We show that Bardeen’s model for a modified Schottky-like interfacial junction can be satisfactorily applied to describe the reverse current–voltage characteristics at intermediate bias voltages.

Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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