Article ID Journal Published Year Pages File Type
747573 Solid-State Electronics 2006 6 Pages PDF
Abstract

This work investigates the conduction band structure of silicon nanowires, its dependence with the wire width and its influences on the electrical performances of Si nanowire-based MOSFET’s working in the ballistic regime. The energy dispersions relations for Si nanowires have been calculated using a sp3 tight-binding model and the ballistic response of n-channel devices with a 3D Poisson–Schrödinger solver considering a mode-space approach and open boundary conditions (NEGF formalism). Results are compared with data obtained considering the parabolic bulk effective mass approximation, highlighting in this last case the overestimation of the Ion current, up to 60% for the smallest (1.36 nm × 1.36 nm Si wire) devices.

Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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