Article ID Journal Published Year Pages File Type
748170 Solid-State Electronics 2009 10 Pages PDF
Abstract

The confined states in strained silicon fully depleted silicon-on-insulator MOSFETs are investigated using full-band k.p method within the envelope-function approximation. Full-band calculations of important transport parameters – energy band shifts, curvature masses and density-of-state masses – show new results, rising the issues of the limit of simple models like the effective mass approximation and the 6-level k.p model.

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Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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