| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 748271 | Solid-State Electronics | 2011 | 10 Pages |
Abstract
⺠Linear Kink Effect shot noise. ⺠Back-Gate Induced Lorentzians. ⺠Multiple-gate FinFETs. ⺠Impact of strain on the excess low-frequency noise.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
N. Lukyanchikova, N. Garbar, V. Kudina, A. Smolanka, E. Simoen, C. Claeys,