Article ID Journal Published Year Pages File Type
748304 Solid-State Electronics 2008 6 Pages PDF
Abstract
This paper first discusses laser crystallization of silicon (Si) films with a carbon optical absorption layer, which makes it possible to use an infrared laser light. Then we discuss heat treatment with high-pressure H2O vapor for defect reduction of laser crystallized Si films and their interface for fabrication of high performance Si thin film transistors (TFTs). Finally, we present a method of transfer process of electrical circuits from original glass substrates to foreign plastic films, developed with GeO2 removing layer.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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