Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
748397 | Solid-State Electronics | 2008 | 5 Pages |
Abstract
In this paper, we investigate the linearity of undoped body multi-gate independent FinFET (MIGFET) experimentally. The MIGFET device with sub-50 nm body thickness is fabricated on SOI wafers. The device transconductance and its high order derivatives under different bias conditions are measured. RF two-tone inter-modulation distortion measurements are performed. Both the DC and RF measurements demonstrate that the properly biased asymmetric MIGFET provides better linearity performance than that of symmetric MIGFET biased at the conventional moderate inversion linearity “sweet spot”. The improved linearity is explained.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Jing-Feng Gong, Philip C.H. Chan,