| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 748580 | Solid-State Electronics | 2012 | 5 Pages |
Abstract
⺠Including surface roughness in the noise mechanism - a new consideration in theory. ⺠Theoretical models for remote Coulomb scattering and surface roughness scattering. ⺠A quantum mechanical treatment of low-frequency noise. ⺠Good agreement in IV and noise characteristics between simulation and experiments.
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Authors
Xiaochen Zhang, Marvin H. White,