Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
748590 | Solid-State Electronics | 2012 | 5 Pages |
In this work, a modified, lumped element graphene field effect device model is presented. The model is based on the “Top-of-the-barrier” approach which is usually valid only for ballistic graphene nanotransistors. Proper modifications are introduced to extend the model’s validity so that it accurately describes both ballistic and diffusive graphene devices. The model is compared to data already presented in the literature. It is shown that a good agreement is obtained for both nano-sized and large area graphene based channels. Accurate prediction of drain current and transconductance for both cases is obtained.
► Simple lumped element model (0D model), low computation time. ► Universal model for both ballistic and diffusive graphene FET devices. ► Correct current voltage saturation prediction.