Article ID Journal Published Year Pages File Type
748623 Solid-State Electronics 2010 6 Pages PDF
Abstract
Two general classes of strategies for extraction of compact model electrical and temperature scaling parameters are identified and compared in the present paper. Applying these to extract parameters of the p-n junction depletion capacitance, we show that the reproducibility of estimated parameter values can strongly depend on the extraction strategy applied in the nonlinear regression procedure. We present an approach to assess statistical properties of parameter extraction strategies and demonstrate the merits of such assessments.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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