Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
749385 | Solid-State Electronics | 2007 | 7 Pages |
Abstract
Energy-filtered X-ray photoemission electron microscopy (EXPEEM) is a new surface chemical imaging method that combines X-ray photoelectron spectroscopy (XPS) and photoemission electron microscopy (PEEM). We have developed a collinear type EXPEEM system using a Wien-filter-type electron energy analyzer. The collinear arrangement has the advantage of carrying out an easy alignment of the electron optical axis. We have measured EXPEEM images, μ-X-ray absorption near edge structure (μ-XANES) and μ-XPS of Au on Ta and Ag(DM)2. We discuss the advantage of EXPEEM and future applications to organic devices.
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Authors
Tetsuya Tsutsumi, Takeshi Miyamoto, Hironobu Niimi, Yoshinori Kitajima, Yuji Sakai, Makoto Kato, Toshio Naito, Kiyotaka Asakura,