Article ID Journal Published Year Pages File Type
749385 Solid-State Electronics 2007 7 Pages PDF
Abstract
Energy-filtered X-ray photoemission electron microscopy (EXPEEM) is a new surface chemical imaging method that combines X-ray photoelectron spectroscopy (XPS) and photoemission electron microscopy (PEEM). We have developed a collinear type EXPEEM system using a Wien-filter-type electron energy analyzer. The collinear arrangement has the advantage of carrying out an easy alignment of the electron optical axis. We have measured EXPEEM images, μ-X-ray absorption near edge structure (μ-XANES) and μ-XPS of Au on Ta and Ag(DM)2. We discuss the advantage of EXPEEM and future applications to organic devices.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
Authors
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