| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7527883 | Safety and Health at Work | 2016 | 8 Pages |
Abstract
For nanoparticle measurement, CPC and SAM might be useful to find source of emission at laboratory and ENP workplaces instead of P-SMPS in the first stage. An SMPS is required to measure with high accuracy. Caution is necessary when comparing data from different nanoparticle measurement devices and RG-SMPSs.
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Authors
Seunghon Ham, Naroo Lee, Igchun Eom, Byoungcheun Lee, Perng-Jy Tsai, Kiyoung Lee, Chungsik Yoon,