Article ID Journal Published Year Pages File Type
752998 Solid-State Electronics 2012 7 Pages PDF
Abstract
► Single-sided non-overlapped implantation nMOSFETs for multiple memory functions. ► Mask ROMs programmed by the source drain extension (SDE) implantation. ► EEPROMs programmed by trapping charges in the side-wall nitride spacers. ► Antifuses programmed by introducing the punch-through stress at the drain side.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
Authors
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