Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
753433 | Solid-State Electronics | 2008 | 5 Pages |
Abstract
In this work, the two-step iteration combined with the nonlinear multiple regression technique to extract physical parameters for diodes, using a simple physical-based current–voltage (I–V) model is demonstrated. This statistical method can be applied for sampling for a wide variety of diodes including light-emitting diodes (LEDs) and Schottky diodes. Our results show the technique is an accurate and systematic approach for extracting diode parameters. The calculated recombination currents indicate the recombination efficiency for LEDs and the quality for Schottky diodes.
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Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Chien-Chih Liu, Chih-Yen Chen, Chi-Yuan Weng, Chien-Chun Wang, Feng-Lin Jenq, Po-Jen Cheng, Yeong-Her Wang, Mau-Phon Houng,