Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
753872 | Applied Acoustics | 2006 | 9 Pages |
Abstract
This paper presents audible vibratory mode data obtained by mechanically exciting acoustic modes in multi-crystalline silicon wafers with various levels and distributions of residual stress. Natural frequency data from the silicon wafers is found to correlate with residual stress optical polariscopy measurements. The data is fit with both linear and quadratic models with correlation coefficients of 0.8. The results reveal a dependence of wafer audible mode frequencies on residual stress level that may be useful for solar cell mechanical quality control and breakage inspection.
Related Topics
Physical Sciences and Engineering
Engineering
Mechanical Engineering
Authors
S.R. Best, D.P. Hess, A. Belyaev, S. Ostapenko, J.P. Kalejs,