Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7674091 | Spectrochimica Acta Part B: Atomic Spectroscopy | 2016 | 4 Pages |
Abstract
A novel approach to quantification of Ga and Zn modifiers in advanced materials based on zinc oxide is presented. The approach includes a combination of total reflection X-ray fluorescence (TXRF) and inductively coupled plasma mass spectrometry (ICP-MS) for determination and validation of the results. It is suggested to use aqueous standards for the direct determination of elements in powder samples by TXRF with a relative standard deviation no more than sr = 0.11. The accuracy of these results was proved by ICP-MS after the sample decomposition, sr(In) = 0.05, sr(Ga) = 0.06 and sr(Zn) = 0.06. It was established that there is a possibility to determine indium above 300 ppb on the background of K-M3 line of argon.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Daria G. Filatova, Nikolai V. Alov, Natalia A. Vorobyeva, Marina N. Rumyantseva, Pavel Yu. Sharanov, Irina F. Seregina, Alexander M. Gaskov,