| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7674654 | Spectrochimica Acta Part B: Atomic Spectroscopy | 2014 | 4 Pages |
Abstract
Quantitative elemental determination for concentrations in the ppb range requires a careful preparation of the sample. In particular, for elemental analysis of very low concentration samples, less than 1Â ng/mm2, a very bright X-ray source, typically synchrotron radiation (SR) in total external reflection fluorescence regime (SR-TXRF), is required. Here, we wish to demonstrate that a conventional source combined with a polycapillary semi-lens can provide a quasi-parallel beam intense enough for desktop TXRF analysis of low concentration samples.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
D. Hampai, S.B. Dabagov, C. Polese, A. Liedl, G. Cappuccio,